Characterization in compound semiconductor processing =...

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Engineering - Industrial Engineering & Materials Science
Characterization in compound...

Characterization in compound semiconductor processing = 化合物半导体加工中的表征

Yale E. Strausser, Gary E. McGuire

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దింపుకొన్న ఫైల్ నాణ్యత ఏమిటి?

పుస్తక నాణ్యత అంచనా వేయడాలనుకుంటే దీన్ని దింపుకోండి

దింపుకొన్న ఫైళ్ళ నాణ్యత ఏమిటి?

వర్గాలు:

Engineering - Industrial Engineering & Materials Science

సంవత్సరం:

2014

భాష:

chinese

ISBN:

40890680

ఫైల్:

PDF, 39.10 MB

IPFS:

,

chinese, 2014

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Brian R. Pamplin (Eds.) — Molecular Beam Epitaxy

S. Mahajan and L. C. Kimerling (Eds.) — Concise Encyclopedia of Semiconducting Materials & Related Technologies

Strausser, Yale — Characterization in Silicon Processing

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Norman G Einspruch; Graydon B Larrabee — Materials and process characterization

K.N. TU and R. ROSENBERG (Eds.) — Preparation and Properties of Thin Films

Mohamed Henini — Molecular Beam Epitaxy: From Research to Mass Production

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Maurice H. Francombe (Eds.) — Frontiers of Thin Film Technology

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E.H.C. Parker — The Technology and Physics of Molecular Beam Epitaxy

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